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Results 1 to 25 of 3885

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Broad band modelling of NiCr resistorsSHARMA, Renu; VINAYAK, Seema; KUMAR, Ashok et al.SPIE proceedings series. 2002, pp 922-925, isbn 0-8194-4500-2, 2VolConference Paper

Soft-error-immune switched-load-resistor memory cellHOMMA, N; NAKAMURA, T; HAYASHIDA, T et al.I.E.E.E. transactions on electron devices. 1988, Vol 35, Num 12, pp 2094-2100, issn 0018-9383Article

Präparation und Messung hochohmiger Polysilizium-Widerstände = Preparation and measurement of high-value polycrystalline silicon resistorsKILPER, R; BRÄUER, W; ERBEN, J et al.Wissenschaftliche Zeitschrift der Technischen Universität Karl-Marx-Stadt. 1989, Vol 31, Num 4, pp 608-612, issn 0863-0615, 5 p.Article

Analysis and design of polygonal resistors by conformal mappingTREFETHEN, L. N.Zeitschrift für angewandte Mathematik und Physik. 1984, Vol 35, Num 5, pp 692-704, issn 0044-2275Article

Overview of automating low, high resistance measurement. IROSENOW, K.Electri.onics. 1985, Vol 31, Num 13, pp 59-63, issn 0745-4309Article

Self-balancing resistance bridgeKAPLAN, A; ZIMMERMAN, G. O; EDMONDS, D. S. JR et al.Review of scientific instruments. 1986, Vol 57, Num 11, pp 2895-2897, issn 0034-6748Article

A new nonautonomous version of Chua's circuit : Experimental observationsKILIC, Recai; SARACOGLU, Ö. Galip; YILDIRIM, Fatma et al.Journal of the Franklin Institute. 2006, Vol 343, Num 2, pp 191-203, issn 0016-0032, 13 p.Article

Minimal realisation for single resistor controlled sinusoidal oscillator using single CCII. RepliesABUELMA'ATTI, M; T;; CELMA, S; MARTINEZ, P et al.Electronics Letters. 1992, Vol 28, Num 13, pp 1264-1265, issn 0013-5194Article

The design of thin-film polysilicon resistors for analog IC applicationsLANE, W. A; WRIXON, G. T.I.E.E.E. transactions on electron devices. 1989, Vol 36, Num 4, pp 738-744, issn 0018-9383, 7 p.Article

La mesure de la résistance des résistances bobinées durant leur bobinagePAPOYAN, S. P.Èlektrotehnika (Moskva, 1963). 1988, Num 6, issn 0013-5860, 77Article

Surface-modified RuO2-based thick film resistors using Nd:YAG laserGOFUKU, E; OGAMA, T; TAKASAGO, H et al.Journal of applied physics. 1989, Vol 66, Num 12, pp 6126-6131, issn 0021-8979, 6 p.Article

Effects of substrate thermal expansion coefficient on the physical and electrical properties of thick film resistorsABE, O; TAKETA, Y; HARADOME, M et al.Thin solid films. 1988, Vol 162, pp 7-12, issn 0040-6090Article

On the resistance of the Sierpinski carpetBARLOW, M. T; BASS, R. F.Proceedings of the royal society of London, series A : mathematical and physical sciences. 1990, Vol 431, Num 1882, pp 345-360, issn 0080-4630Article

AC conduction in metal-oxide cermets. II: Sn-oxide resistors = Conduction AC dans les cermets métal-oxyde. II. Résistors Sn-oxydeHALDER, N. C; NAGARAJAN, L. C.Physica status solidi. A. Applied research. 1989, Vol 113, Num 2, pp 511-518, issn 0031-8965, 8 p.Article

Inter-diffusion phenomena and electrical conduction in thick-film segmented-resistor structuresKHANNA, P. K; BHATNAGAR, S. K; SISODIA, M. L et al.Journal of physics. D, Applied physics (Print). 1988, Vol 21, Num 12, pp 1796-1801, issn 0022-3727Article

Precise calibration of a standard resistor with one reference standardRAHAT HUSAIN.Measurement. 1993, Vol 11, Num 2, pp 173-177, issn 0263-2241Article

Incorporating planar resistors in PCB designsSIGNER, R. M.Electronic manufacturing. 1989, Vol 35, Num 1, pp 22-24, 3 p.Article

Resistance measurements on point-contact diodesRICCIUS, H. D; JONES, L. H.Applied physics letters. 1989, Vol 54, Num 9, pp 825-827, issn 0003-6951, 3 p.Article

Approximate evaluation of cell resistance with resistive electrodesAOKI, K; NISHIKI, Y; TOKUDA, K et al.Journal of applied electrochemistry. 1987, Vol 17, Num 3, pp 552-558, issn 0021-891XArticle

Prediction of quench in cable-in-conduit conductors considering current-sharing effect of copperTAN, Y. F; WENG, P. D; XIAO, B. J et al.Cryogenics (Guildford). 2006, Vol 46, Num 7-8, pp 615-618, issn 0011-2275, 4 p.Conference Paper

One-dimensional quantised ballistic resistors in parallel configurationSMITH, C. G; PEPPER, M; NEWBURY, R et al.Journal of physics. Condensed matter (Print). 1989, Vol 1, Num 37, pp 6763-6770, issn 0953-8984Article

Effective base resistance of bipolar transistorsLARY, J. E; ANDERSON, R. L.I.E.E.E. transactions on electron devices. 1985, Vol 32, Num 11, pp 2503-2505, issn 0018-9383Article

On a class of SC resistors and its application to the synthesis of non-linear driving-point and transfer-characteristics plotsRODRIGUEZ-VAZQUEZ, Z; HUERTAS, J. L; CHUA, L. O et al.International journal of circuit theory and applications. 1985, Vol 13, Num 4, pp 309-326, issn 0098-9886Article

Water-soluble barrier material for three-layer resist systemsNAMATSU, H; SHIBATA, T.Japanese journal of applied physics. 1985, Vol 24, Num 10, pp L789-L791, issn 0021-4922Article

Direct determination of the conductivity exponent in directed percolationBALBERG, I; BINENBAUM, N.Physical review. B, Condensed matter. 1986, Vol 33, Num 3, pp 2017-2019, issn 0163-1829Article

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